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Disambiguation of "Tancorre, Vincenzo"

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An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

, , , , , , and . ETS, page 1-6. IEEE, (2022)

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Vincenzo Casulli

Vincenzo Ferrazzano

Vincenzo Mercurio

Vincenzo Mancuso

Vincenzo Gulisano

 

Other publications of authors with the same name

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , and 1 other author(s). IEEE Trans. Computers, 72 (5): 1447-1459 (May 2023)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , and . MTDT, page 12-16. IEEE Computer Society, (2002)On the integration and hardening of Software Test Libraries in Real-Time Operating Systems., , , , , , , and . LATS, page 1-6. IEEE, (2023)An innovative Strategy to Quickly Grade Functional Test Programs., , , , , , , , , and . ITC, page 355-364. IEEE, (2022)About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics., , , , , and . IOLTS, page 1-7. IEEE, (2023)Innovative methods for Burn-In related Stress Metrics Computation., , , , , , , , and . DTIS, page 1-6. IEEE, (2021)A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip., , , , , , and . LATS, page 1-6. IEEE, (2022)In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip., , , , , and . ITC, page 646-649. IEEE, (2022)