( en | de | ru )

 

Disambiguation of "Yoshimura, Masayoshi"

Author of the publication

copydeleteadd this publication to your clipboard
A Don't Care Filling Method to Reduce Capture Power Based on Correlation of FF Transitions.

, , , and . ATS, page 13-18. IEEE Computer Society, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tateo Yoshimura

Tadasuke Yoshimura

 

Other publications of authors with the same name

A Test Register Assignment Method Based on Controller Augmentation to Reduce the Number of Test Patterns., , , and . IOLTS, page 228-231. IEEE, (2018)Controller augmentation and test point insertion at RTL for concurrent operational unit testing., , , and . IOLTS, page 17-20. IEEE, (2017)A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths., , , and . IOLTS, page 293-298. IEEE, (2019)A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively., , , , , and . DFT, page 1-6. IEEE, (2019)A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method., , , , and . IOLTS, page 1-4. IEEE, (2020)An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing., , , and . DFT, page 1-6. IEEE, (2023)Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure., , , , , , , , and . IOLTS, page 151-156. IEEE Computer Society, (2011)A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification., , , , , , and . IOLTS, page 43-46. IEEE, (2018)Collaborative optimization for product design and manufacturing.. CAD, page 1-16. GI German Informatics Society, (2002)SemanticObjects and Biomedical Informatics., and . BIBE, page 497-502. IEEE Computer Society, (2004)