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A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST.

, and . ITC, page 389-395. IEEE Computer Society, (1997)

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Mid-bond Interposer Wire Test., , , , and . Asian Test Symposium, page 153-158. IEEE Computer Society, (2013)Test Metrics for Analog Parametric Faults., and . VTS, page 226-235. IEEE Computer Society, (1999)The P1149.4 Mixed Signal Test Bus: Costs and Benefits.. ITC, page 444-450. IEEE Computer Society, (1995)BIST vs. ATE: need a different vehicle?. ITC, page 1148. IEEE Computer Society, (1998)Innovative practices session 4C: Disruptive solutions in the non-digital world., , , , and . VTS, page 1. IEEE Computer Society, (2014)Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost., and . ITC, page 446-455. IEEE Computer Society, (2002)Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus.. ITC, page 228-235. IEEE Computer Society, (2003)Correct by construction is guaranteed to fail.. ITC, page 1. IEEE Computer Society, (2005)How Should Fault Coverage Be Defined?, and . VTS, page 325-328. IEEE Computer Society, (2000)Innovative practices session 7C: Reduced pin-count testing - How low can we go?, , , and . VTS, page 1. IEEE Computer Society, (2014)