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An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.
Jinyu J. Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, and Robert Plana IEEE T. Instrumentation and Measurement 61(2):456-461 (2012)
to dblp by dblp on Feb 13, 2012, 12:00 AM
URL | BibTeX
Accelerated lifetime test of RF-MEMS switches under ESD stress.
J. Ruan, Nicolas Nolhier, G. J. Papaioannou, D. Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, and Robert Plana Microelectronics Reliability 49(9-11):1256-1259 (2009)
to dblp by dblp and 1 other user on Feb 13, 2012, 12:00 AM
URL | BibTeX
Electrostatic discharge failure analysis of capacitive RF MEMS switches.
J. Ruan, Nicolas Nolhier, M. Bafleur, L. Bary, Fabio Coccetti, T. Lisec, and Robert Plana Microelectronics Reliability 47(9-11):1818-1822 (2007)
to dblp by dblp and 1 other user on Feb 13, 2012, 12:00 AM
URL | BibTeX
ESD failure signature in capacitive RF MEMS switches.
J. Ruan, G. J. Papaioannou, Nicolas Nolhier, N. Mauran, M. Bafleur, Fabio Coccetti, and Robert Plana Microelectronics Reliability 48(8-9):1237-1240 (2008)
to dblp by dblp and 1 other user on Feb 13, 2012, 12:00 AM
URL | BibTeX
SpiNNaker: Design and Implementation of a GALS Multicore System-on-Chip.
Luis A. Plana, David M. Clark, Simon Davidson, Steve Furber, Jim D. Garside, Eustace Painkras, Jeffrey Pepper, Steve Temple, and John Bainbridge JETC 7(4):17 (2011)
to dblp by dblp on Feb 3, 2012, 12:00 AM
URL | BibTeX
SpiNNaker: Mapping neural networks onto a massively-parallel chip multiprocessor.
Muhammad Mukaram Khan, David R. Lester, Luis A. Plana, Alexander D. Rast, Xin Jin, Eustace Painkras, and Stephen B. Furber IJCNN, page 2849-2856. IEEE, (2008)
to dblp by dblp on Feb 3, 2012, 12:00 AM
URL | BibTeX
Performance Evaluation of Beamforming Solutions for mmWave Wireless Systems.
Florian Perget, Daniela Dragomirescu, Martin Jacob, Thomas Kürner, Cicero Vaucher, and Robert Plana GLOBECOM, page 1-5. IEEE, (2011)
to dblp by dblp on Jan 24, 2012, 12:00 AM
URL | BibTeX
SPA - A Synthesisable Amulet Core for Smartcard pplications.
W. J. Bainbridge, Andrew Bardsley, Steve Temple, Jim D. Garside, P. A. Riocreux, and Luis A. Plana ASYNC, page 201-210. IEEE Computer Society, (2002)
to dblp by dblp on Jan 6, 2012, 12:00 AM
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Low power digital TTL command for 1 bit 60 GHz RF MEMS phase shifter.
Thomas Beluch, Daniela Dragomirescu, Vincent Puyal, and Robert Plana Microelectronics Journal 42(12):1321-1326 (2011)
to dblp by dblp on Dec 20, 2011, 12:00 AM
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New facets and an enhanced branch-and-cut for the min-max K-vehicles windy rural postman problem.
Enrique Benavent, Angel Corberán, Isaac Plana, and José M. Sanchis Networks 58(4):255-272 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Concurrent heterogeneous neural model simulation on real-time neuromimetic hardware.
Alexander D. Rast, Francesco Galluppi, Sergio Davies, Luis Plana, Cameron Patterson, Thomas Sharp, David R. Lester, and Steve Furber Neural Networks 24(9):961-978 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Structure dependent charging process in RF MEMS capacitive switches.
E. Papandreou, M. Lamhamdi, C. M. Skoulikidou, Patrick Pons, George Papaioannou, and Robert Plana Microelectronics Reliability 47(9-11):1812-1817 (2007)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
M. Lamhamdi, Patrick Pons, Usama Zaghloul, L. Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1248-1252 (2008)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Erratum to Ön the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" MR 51/9-11 2011 1810-1818.
Usama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 51(12):2416 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
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On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Usama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 51(9-11):1810-1818 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Alpha particle radiation effects in RF MEMS capacitive switches.
J. Ruan, E. Papandreou, M. Lamhamdi, M. Koutsoureli, Fabio Coccetti, Patrick Pons, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1241-1244 (2008)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
A. Belarni, M. Lamhamdi, Patrick Pons, L. Boudou, J. Guastavino, Y. Segui, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1232-1236 (2008)
to dblp by dblp on Dec 19, 2011, 12:00 AM
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Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Usama Zaghloul, George Papaioannou, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 49(9-11):1309-1314 (2009)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Usama Zaghloul, M. Koutsoureli, H. Wang, Fabio Coccetti, George Papaioannou, Patrick Pons, and Robert Plana Microelectronics Reliability 50(9-11):1615-1620 (2010)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Study of Reconfigurable Mostly Digital Radio for Manet
Aubin Lecointre, Daniela Dragomirescu, and Robert Plana CoRR (2010)
to dblp by dblp on Dec 5, 2011, 12:00 AM
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