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Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors., , , , and . J. Electron. Test., 26 (3): 355-365 (2010)A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications., , , , , and . J. Electron. Test., 23 (6): 593-603 (2007)Analysis and design of LC oscillators associated with frequency multipliers: a phase noise perspective., , , , and . Int. J. Circuit Theory Appl., 45 (12): 2017-2033 (2017)RF CMOS body-effect circuits., , , and . Microelectron. J., 37 (11): 1251-1260 (2006)A 10-Gb/s CMOS fully integrated ILO-based CDR., , , , , and . ESSCIRC, page 520-523. IEEE, (2007)Current reuse CMOS LNA for UWB applications., , and . ESSCIRC, page 294-297. IEEE, (2008)BIST scheme for RF VCOs allowing the self-correction of the cut., , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Voltage controlled delay line with phase quadrature outputs for 0.9-4 GHz F-DLL dedicated to zero-IF multi-standard LO., , , and . SBCCI, ACM, (2009)Windowed phase comparator for an 80Gbit/s CDR., , , , , , and . ICECS, page 185-188. IEEE, (2012)Reconfigurable Ultra Low Power LNA for 2.4GHz Wireless Sensor Networks., , , , and . ICECS, page 74-77. IEEE, (2010)