%0 Conference Paper %1 conf/ats/LuSW00 %A Lu, Shyue-Kung %A Shih, Jen-Sheng %A Wu, Cheng-Wen %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 429- %T A Testable/Fault Tolerant FFT Processor Design. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LuSW00 %@ 0-7695-0887-1

@inproceedings{conf/ats/LuSW00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lu, Shyue-Kung and Shih, Jen-Sheng and Wu, Cheng-Wen}, biburl = {https://www.bibsonomy.org/bibtex/2f453a4718f0c4431f709511ca40c3e25/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893661}, interhash = {1148670f35e8c7f6cd86551a231c8596}, intrahash = {f453a4718f0c4431f709511ca40c3e25}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {429-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {A Testable/Fault Tolerant FFT Processor Design.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LuSW00}, year = 2000 }