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Disambiguation of "Lu, Shyue-Kung"

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A Testable/Fault Tolerant FFT Processor Design.

, , and . Asian Test Symposium, page 429-. IEEE Computer Society, (2000)

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Lu Lu

Zigmas Kungys

Hans Kungl

Angela Brigitte Kung

Sebastian Küng

 

Other publications of authors with the same name

Combinational circuit fault diagnosis using logic emulation., , , , and . ISCAS (5), page 549-552. IEEE, (2003)Efficient test and repair architectures for 3D TSV-based random access memories., , , and . VLSI-DAT, page 1-4. IEEE, (2013)Hybrid scrambling technique for increasing the fabrication yield of NROM-Based ROMs., , , and . VLSI-DAT, page 1-4. IEEE, (2015)A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume., , , , and . ISCIT, page 1-5. IEEE, (2017)Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults., , , , , and . J. Inf. Sci. Eng., 19 (4): 571-587 (2003)A built-in supply current test circuit for electrical interconnect tests of 3D ICs., , , and . 3DIC, page 1-6. IEEE, (2014)Defect Level Prediction Using Multi-Model Fault Coverage.. IEICE Trans. Inf. Syst., 87-D (6): 1488-1495 (2004)A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs., , , , , , and . IEICE Trans. Inf. Syst., 99-D (11): 2723-2733 (2016)A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs., , , , and . IEICE Trans. Inf. Syst., 101-D (8): 2053-2063 (2018)Yield enhancement techniques for 3-dimensional random access memories., , and . Microelectron. Reliab., 52 (6): 1065-1070 (2012)