%0 Conference Paper %1 conf/date/NicolaidisAZZKBTLTRKKDA12 %A Nicolaidis, Michael %A Anghel, Lorena %A Zergainoh, Nacer-Eddine %A Zorian, Yervant %A Karnik, Tanay %A Bowman, Keith A. %A Tschanz, James W. %A Lu, Shih-Lien %A Tokunaga, Carlos %A Raychowdhury, Arijit %A Khellah, Muhammad M. %A Kulkarni, Jaydeep %A De, Vivek %A Avresky, Dimiter %B DATE %D 2012 %E Rosenstiel, Wolfgang %E Thiele, Lothar %I IEEE %K dblp %P 677-682 %T Design for test and reliability in ultimate CMOS. %U http://dblp.uni-trier.de/db/conf/date/date2012.html#NicolaidisAZZKBTLTRKKDA12 %@ 978-1-4577-2145-8

@inproceedings{conf/date/NicolaidisAZZKBTLTRKKDA12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nicolaidis, Michael and Anghel, Lorena and Zergainoh, Nacer-Eddine and Zorian, Yervant and Karnik, Tanay and Bowman, Keith A. and Tschanz, James W. and Lu, Shih-Lien and Tokunaga, Carlos and Raychowdhury, Arijit and Khellah, Muhammad M. and Kulkarni, Jaydeep and De, Vivek and Avresky, Dimiter}, biburl = {https://www.bibsonomy.org/bibtex/26ba399fdfe91819053e9d197e0df9075/dblp}, booktitle = {DATE}, crossref = {conf/date/2012}, editor = {Rosenstiel, Wolfgang and Thiele, Lothar}, ee = {http://dl.acm.org/citation.cfm?id=2492878}, interhash = {3816d206b29a0b8bf87facd17f2d7a84}, intrahash = {6ba399fdfe91819053e9d197e0df9075}, isbn = {978-1-4577-2145-8}, keywords = {dblp}, pages = {677-682}, publisher = {IEEE}, timestamp = {2024-04-10T06:49:32.000+0200}, title = {Design for test and reliability in ultimate CMOS.}, url = {http://dblp.uni-trier.de/db/conf/date/date2012.html#NicolaidisAZZKBTLTRKKDA12}, year = 2012 }