%0 Conference Paper %1 conf/ats/NiiTIYFO12 %A Nii, Koji %A Tsukamoto, Yasumasa %A Ishii, Yuichiro %A Yabuuchi, Makoto %A Fujiwara, Hidehiro %A Okamoto, Kazuyoshi %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 246-251 %T A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NiiTIYFO12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/NiiTIYFO12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nii, Koji and Tsukamoto, Yasumasa and Ishii, Yuichiro and Yabuuchi, Makoto and Fujiwara, Hidehiro and Okamoto, Kazuyoshi}, biburl = {https://www.bibsonomy.org/bibtex/2914d1c5313d491e2cab38acb4aedae24/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.59}, interhash = {506fde08a78b8c941b9fc84b7a6b85f6}, intrahash = {914d1c5313d491e2cab38acb4aedae24}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {246-251}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NiiTIYFO12}, year = 2012 }