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Disambiguation of "Yabuuchi, Makoto"

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A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues.

, , , , , and . Asian Test Symposium, page 246-251. IEEE Computer Society, (2012)

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Makoto Yamamoto

Makoto Nakamura

Makoto Arai

Makoto Ida

Makoto Kobayashi

 

Other publications of authors with the same name

A stable chip-ID generating physical uncloneable function using random address errors in SRAM., , , , , , and . SoCC, page 143-147. IEEE, (2012)A Ternary Based Bit Scalable, 8.80 TOPS/W CNN accelerator with Many-core Processing-in-memory Architecture with 896K synapses/mm2., , , and . VLSI Circuits, page 248-. IEEE, (2019)28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique., , , , , , , , , and 1 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 575-584 (2014)A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations., , , , , , , , , and 6 other author(s). ISSCC, page 326-606. IEEE, (2007)A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die., , , , , , , , , and 7 other author(s). ISSCC, page 488-617. IEEE, (2007)A cost-effective 45nm 6T-SRAM reducing 50mV Vmin and 53% standby leakage with multi-Vt asymmetric halo MOS and write assist circuitry., , , , , , and . ISQED, page 438-441. IEEE, (2013)A 512-kb 1-GHz 28-nm partially write-assisted dual-port SRAM with self-adjustable negative bias bitline., , , , , , , and . VLSIC, page 1-2. IEEE, (2014)12-NM Fin-FET 3.0G-Search/s 80-Bit × 128-Entry Dual-Port Ternary CAM., , , and . VLSI Circuits, page 19-20. IEEE, (2018)1.8 Mbit/mm2 ternary-CAM macro with 484 ps search access time in 16 nm Fin-FET bulk CMOS technology., , , , and . VLSIC, page 274-. IEEE, (2015)13.3 20nm High-density single-port and dual-port SRAMs with wordline-voltage-adjustment system for read/write assists., , , , and . ISSCC, page 234-235. IEEE, (2014)