%0 Conference Paper %1 conf/asicon/YangZYXLB15 %A Yang, Kai %A Zhao, Yanqing %A Yang, Jianguo %A Xue, Xiaoyong %A Lin, Yinyin %A Bae, Jun-Soo %B ASICON %D 2015 %I IEEE %K dblp %P 1-4 %T Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2015.html#YangZYXLB15 %@ 978-1-4799-8485-5

@inproceedings{conf/asicon/YangZYXLB15, added-at = {2018-07-17T00:00:00.000+0200}, author = {Yang, Kai and Zhao, Yanqing and Yang, Jianguo and Xue, Xiaoyong and Lin, Yinyin and Bae, Jun-Soo}, biburl = {https://www.bibsonomy.org/bibtex/237d42c8fc9bc7ebd0483636813175b83/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2015}, ee = {https://doi.org/10.1109/ASICON.2015.7517139}, interhash = {52e820c9e30c5e865a036c1965cd58da}, intrahash = {37d42c8fc9bc7ebd0483636813175b83}, isbn = {978-1-4799-8485-5}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2018-07-18T11:44:51.000+0200}, title = {Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2015.html#YangZYXLB15}, year = 2015 }