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Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.

K. Yang, Y. Zhao, J. Yang, X. Xue, Y. Lin, and J. Bae. ASICON, page 1-4. IEEE, (2015)

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Yinyin Yuan

Lin Lin

Other publications of authors with the same name

A BIST scheme for high-speed Gain Cell eDRAM.B. Yan, Y. Xie, R. Yuan, and Y. Lin. ASICON, page 244-247. IEEE, (2011)A 2Mb ReRAM with two bits error correction codes circuit for high reliability application.J. Yang, Y. Meng, X. Xue, R. Huang, Q. Zhou, J. Wu, and Y. Lin. ASICON, page 1-4. IEEE, (2013)3D domain wall memory-cell structure, array architecture and operation algorithm with anti-disturbance.Y. Fu, K. Yang, B. Chen, and Y. Lin. Microelectron. J., (2017)Multilevel Storage in Phase-Change Memory.Y. Hong, Y. Lin, T. Tang, and B. Chen. IEICE Trans. Electron., 90-C (3): 634-640 (2007)A Logic Resistive Memory Chip for Embedded Key Storage With Physical Security.Y. Xie, X. Xue, J. Yang, Y. Lin, Q. Zou, R. Huang, and J. Wu. IEEE Trans. Circuits Syst. II Express Briefs, 63-II (4): 336-340 (2016)Novel 2T programmable element to improve density and performance of FPGA.X. Xue, Y. Xie, and Y. Lin. IEICE Electron. Express, 8 (7): 454-459 (2011)64Kb logic RRAM chip resisting physical and side-channel attacks for encryption keys storage.Y. Xie, W. Jian, X. Xue, G. Jin, and Y. Lin. IEICE Electron. Express, 9 (12): 1051-1056 (2012)Low-Power Variation-Tolerant Nonvolatile Lookup Table Design.X. Xue, J. Yang, Y. Lin, R. Huang, Q. Zou, and J. Wu. IEEE Trans. Very Large Scale Integr. Syst., 24 (3): 1174-1178 (2016)A small area and low power true random number generator using write speed variation of oxidebased RRAM for IoT security application.J. Yang, Y. Lin, Y. Fu, X. Xue, and B. Chen. ISCAS, page 1-4. IEEE, (2017)A low cost and high reliability true random number generator based on resistive random access memory.J. Yang, J. Xu, B. Wang, X. Xue, R. Huang, Q. Zou, J. Wu, and Y. Lin. ASICON, page 1-4. IEEE, (2015)

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Disambiguation of "Lin, Yinyin"

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Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.

Please choose a person to relate this publication to

Yinyin Yuan

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lin, Yinyin"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.

Please choose a person to relate this publication to

Yinyin Yuan

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.