%0 Conference Paper %1 conf/iscas/BolchiniBSS94 %A Bolchini, Cristiana %A Buonanno, Giacomo %A Sciuto, Donatella %A Stefanelli, Renato %B ISCAS %D 1994 %I IEEE %K dblp %P 83-86 %T CMOS Reliability Improvements Through a New Fault Tolerant Technique. %U http://dblp.uni-trier.de/db/conf/iscas/iscas1994-4.html#BolchiniBSS94 %@ 0-7803-1916-8

@inproceedings{conf/iscas/BolchiniBSS94, added-at = {2016-05-23T00:00:00.000+0200}, author = {Bolchini, Cristiana and Buonanno, Giacomo and Sciuto, Donatella and Stefanelli, Renato}, biburl = {https://www.bibsonomy.org/bibtex/2a336e3d7356faa110c7745ad82de82fb/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/1994}, ee = {http://dx.doi.org/10.1109/ISCAS.1994.409202}, interhash = {8ce68e11315276fccc769401eacd7397}, intrahash = {a336e3d7356faa110c7745ad82de82fb}, isbn = {0-7803-1916-8}, keywords = {dblp}, pages = {83-86}, publisher = {IEEE}, timestamp = {2016-05-24T11:51:44.000+0200}, title = {CMOS Reliability Improvements Through a New Fault Tolerant Technique.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas1994-4.html#BolchiniBSS94}, year = 1994 }