%0 Journal Article %1 journals/mr/RossettoMCBSPDT17 %A Rossetto, Isabella %A Meneghini, Matteo %A Canato, Eleonora %A Barbato, Marco %A Stoffels, Steve %A Posthuma, Niels %A Decoutere, Stefaan %A Tallarico, Andrea Natale %A Meneghesso, Gaudenzio %A Zanoni, Enrico %D 2017 %J Microelectron. Reliab. %K dblp %P 298-303 %T Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#RossettoMCBSPDT17 %V 76-77

@article{journals/mr/RossettoMCBSPDT17, added-at = {2024-05-07T00:00:00.000+0200}, author = {Rossetto, Isabella and Meneghini, Matteo and Canato, Eleonora and Barbato, Marco and Stoffels, Steve and Posthuma, Niels and Decoutere, Stefaan and Tallarico, Andrea Natale and Meneghesso, Gaudenzio and Zanoni, Enrico}, biburl = {https://www.bibsonomy.org/bibtex/265681e7c3e7b0be758f277189d8a2b9b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.061}, interhash = {a4c1f04910d6535b0c7c57dd8c9083dc}, intrahash = {65681e7c3e7b0be758f277189d8a2b9b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {298-303}, timestamp = {2024-05-13T07:47:56.000+0200}, title = {Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#RossettoMCBSPDT17}, volume = {76-77}, year = 2017 }