%0 Conference Paper %1 conf/itc/KajiharaMTWMHS06 %A Kajihara, Seiji %A Morishima, Shohei %A Takuma, Akane %A Wen, Xiaoqing %A Maeda, Toshiyuki %A Hamada, Shuji %A Sato, Yasuo %B ITC %D 2006 %E Davidson, Scott %E Gattiker, Anne %I IEEE Computer Society %K dblp %P 1-6 %T A Framework of High-quality Transition Fault ATPG for Scan Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc2006.html#KajiharaMTWMHS06 %@ 1-4244-0292-1

@inproceedings{conf/itc/KajiharaMTWMHS06, added-at = {2017-05-24T00:00:00.000+0200}, author = {Kajihara, Seiji and Morishima, Shohei and Takuma, Akane and Wen, Xiaoqing and Maeda, Toshiyuki and Hamada, Shuji and Sato, Yasuo}, biburl = {https://www.bibsonomy.org/bibtex/2fe1593f6c0542416d0dd41cf8730c8b8/dblp}, booktitle = {ITC}, crossref = {conf/itc/2006}, editor = {Davidson, Scott and Gattiker, Anne}, ee = {https://doi.org/10.1109/TEST.2006.297683}, interhash = {e5905bfaffbf7b60c76744c11caafb01}, intrahash = {fe1593f6c0542416d0dd41cf8730c8b8}, isbn = {1-4244-0292-1}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T00:23:16.000+0200}, title = {A Framework of High-quality Transition Fault ATPG for Scan Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#KajiharaMTWMHS06}, year = 2006 }