%0 Conference Paper %1 conf/dft/LiHHTHLMHBWTW10 %A Li, Tsung-Yeh %A Huang, Shi-Yu %A Hsu, Hsuan-Jung %A Tzeng, Chao-Wen %A Huang, Chih-Tsun %A Liou, Jing-Jia %A Ma, Hsi-Pin %A Huang, Po-Chiun %A Bor, Jenn-Chyou %A Wu, Cheng-Wen %A Tien, Ching-Cheng %A Wang, Mike %B DFT %D 2010 %I IEEE Computer Society %K dblp %P 340-348 %T AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. %U http://dblp.uni-trier.de/db/conf/dft/dft2010.html#LiHHTHLMHBWTW10 %@ 978-1-4244-8447-8

@inproceedings{conf/dft/LiHHTHLMHBWTW10, added-at = {2023-09-30T00:00:00.000+0200}, author = {Li, Tsung-Yeh and Huang, Shi-Yu and Hsu, Hsuan-Jung and Tzeng, Chao-Wen and Huang, Chih-Tsun and Liou, Jing-Jia and Ma, Hsi-Pin and Huang, Po-Chiun and Bor, Jenn-Chyou and Wu, Cheng-Wen and Tien, Ching-Cheng and Wang, Mike}, biburl = {https://www.bibsonomy.org/bibtex/23887bc3f58369e8bff7f0be3f916ac2a/dblp}, booktitle = {DFT}, crossref = {conf/dft/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2010.48}, interhash = {fbb376b361a47ad537c20ebb8b4ca570}, intrahash = {3887bc3f58369e8bff7f0be3f916ac2a}, isbn = {978-1-4244-8447-8}, keywords = {dblp}, pages = {340-348}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:37.000+0200}, title = {AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2010.html#LiHHTHLMHBWTW10}, year = 2010 }