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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.

, , , , , , , , , , , and . DFT, page 340-348. IEEE Computer Society, (2010)

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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects., , , , , , , , , and 2 other author(s). DFT, page 340-348. IEEE Computer Society, (2010)AC-Plus Scan Methodology for Small Delay Testing and Characterization., , , , , , , , , and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 21 (2): 329-341 (2013)