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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.

T. Li, S. Huang, H. Hsu, C. Tzeng, C. Huang, J. Liou, H. Ma, P. Huang, J. Bor, C. Wu, C. Tien, and M. Wang. DFT, page 340-348. IEEE Computer Society, (2010)

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Jia-Jing Lee

Jia Jia

Konstantinos Lioupis

Hwa-Meei Liou

Aglaia Liourdi

Other publications of authors with the same name

Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models.A. Krstic, L. Wang, K. Cheng, J. Liou, and T. Mak. DAC, page 668-673. ACM, (2003)Fast Statistical Timing Analysis By Probabilistic Event Propagation.J. Liou, K. Cheng, S. Kundu, and A. Krstic. DAC, page 661-666. ACM, (2001)Pseudo-Multiple-Exposure-Based Tone Fusion With Local Region Adjustment.T. Wang, C. Chiu, W. Wu, J. Wang, C. Lin, C. Chiu, and J. Liou. IEEE Trans. Multim., 17 (4): 470-484 (2015)Diagnosis Framework for Locating Failed Segments of Path Delay Faults.Y. Chen, and J. Liou. IEEE Trans. Very Large Scale Integr. Syst., 16 (6): 755-765 (2008)AC-Plus Scan Methodology for Small Delay Testing and Characterization.T. Li, S. Huang, H. Hsu, C. Tzeng, C. Huang, J. Liou, H. Ma, P. Huang, J. Bor, C. Tien and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 21 (2): 329-341 (2013)Diagnosis framework for locating failed segments of path delay faults.Y. Chen, M. Kuo, and J. Liou. ITC, page 8. IEEE Computer Society, (2005)Delay testing considering crosstalk-induced effects.A. Krstic, J. Liou, Y. Jiang, and K. Cheng. ITC, page 558-567. IEEE Computer Society, (2001)An efficient SAT-based path delay fault ATPG with an unified sensitization model.S. Lu, M. Hsieh, and J. Liou. ITC, page 1-7. IEEE Computer Society, (2007)A prototype of a wireless-based test system.J. Liou, C. Huang, C. Wu, C. Tien, C. Wang, H. Ma, Y. Chen, Y. Hsu, L. Denq, C. Chiu and 2 other author(s). SoCC, page 225-228. IEEE, (2007)Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation.J. Liou, L. Wang, A. Krstic, and K. Cheng. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 86-A (12): 3038-3048 (2003)

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Disambiguation of "Liou, Jing-Jia"

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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.

Please choose a person to relate this publication to

Jia-Jing Lee

Jia Jia

Konstantinos Lioupis

Hwa-Meei Liou

Aglaia Liourdi

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Liou, Jing-Jia"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.

Please choose a person to relate this publication to

Jia-Jing Lee

Jia Jia

Konstantinos Lioupis

Hwa-Meei Liou

Aglaia Liourdi

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.