%0 Conference Paper %1 conf/iscas/CaoT95 %A Cao, Yuming %A Temes, Gabor C. %B ISCAS %D 1995 %I IEEE %K dblp %P 1848-1851 %T CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout. %U http://dblp.uni-trier.de/db/conf/iscas/iscas1995-3.html#CaoT95 %@ 0-7803-2570-2

@inproceedings{conf/iscas/CaoT95, added-at = {2016-05-20T00:00:00.000+0200}, author = {Cao, Yuming and Temes, Gabor C.}, biburl = {https://www.bibsonomy.org/bibtex/238d3129bf3b4710401cc05b8510c3488/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/1995}, ee = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3941}, interhash = {3712398ae64df801005fb878488f5cf6}, intrahash = {38d3129bf3b4710401cc05b8510c3488}, isbn = {0-7803-2570-2}, keywords = {dblp}, pages = {1848-1851}, publisher = {IEEE}, timestamp = {2016-05-21T12:16:25.000+0200}, title = {CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas1995-3.html#CaoT95}, year = 1995 }