%0 Conference Paper %1 conf/ats/HanaiYMYF01 %A Hanai, Hisayoshi %A Yamada, Shinji %A Mori, Hisaya %A Yamashita, Eisaku %A Funakura, Teruhiko %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 460 %T Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HanaiYMYF01 %@ 0-7695-1378-6

@inproceedings{conf/ats/HanaiYMYF01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hanai, Hisayoshi and Yamada, Shinji and Mori, Hisaya and Yamashita, Eisaku and Funakura, Teruhiko}, biburl = {https://www.bibsonomy.org/bibtex/271611a1c5eca67b08f162abf97e2c815/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990330}, interhash = {44af96bf3f9a2deb2020003978bc8abe}, intrahash = {71611a1c5eca67b08f162abf97e2c815}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = 460, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HanaiYMYF01}, year = 2001 }