%0 Conference Paper %1 conf/date/LiXWNP15 %A Li, Ji %A Xie, Qing %A Wang, Yanzhi %A Nazarian, Shahin %A Pedram, Massoud %B DATE %D 2015 %E Nebel, Wolfgang %E Atienza, David %I ACM %K dblp %P 1579-1582 %T Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique. %U http://dblp.uni-trier.de/db/conf/date/date2015.html#LiXWNP15 %@ 978-3-9815370-4-8

@inproceedings{conf/date/LiXWNP15, added-at = {2021-08-09T00:00:00.000+0200}, author = {Li, Ji and Xie, Qing and Wang, Yanzhi and Nazarian, Shahin and Pedram, Massoud}, biburl = {https://www.bibsonomy.org/bibtex/278f370229b2d29b1db139aec6d31f9a1/dblp}, booktitle = {DATE}, crossref = {conf/date/2015}, editor = {Nebel, Wolfgang and Atienza, David}, ee = {https://ieeexplore.ieee.org/document/7092643/}, interhash = {f29e7e10c0a98c9dcf222558dfb0876c}, intrahash = {78f370229b2d29b1db139aec6d31f9a1}, isbn = {978-3-9815370-4-8}, keywords = {dblp}, pages = {1579-1582}, publisher = {ACM}, timestamp = {2024-04-10T06:47:29.000+0200}, title = {Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique.}, url = {http://dblp.uni-trier.de/db/conf/date/date2015.html#LiXWNP15}, year = 2015 }