Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Conference Paper
%1 conf/ats/SrinivasAB95
%A Srinivas, Mandyam-Komar
%A Agrawal, Vishwani D.
%A Bushnell, Michael L.
%B Asian Test Symposium
%D 1995
%I IEEE Computer Society
%K dblp
%P 339-345
%T Functional test generation for path delay faults.
%U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#SrinivasAB95
%@ 0-8186-7129-7
@inproceedings{conf/ats/SrinivasAB95,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Srinivas, Mandyam-Komar and Agrawal, Vishwani D. and Bushnell, Michael L.},
biburl = {https://www.bibsonomy.org/bibtex/219745e821cac0331631350e8f5d25545/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/1995},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485358},
interhash = {29bf8a181980eaa1d8ec70dc3ebb646f},
intrahash = {19745e821cac0331631350e8f5d25545},
isbn = {0-8186-7129-7},
keywords = {dblp},
pages = {339-345},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:35:47.000+0200},
title = {Functional test generation for path delay faults.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#SrinivasAB95},
year = 1995
}