%0 Journal Article %1 journals/mr/DanesinZGRMZP06 %A Danesin, Francesca %A Zanon, Franco %A Gerardin, Simone %A Rampazzo, Fabiana %A Meneghesso, Gaudenzio %A Zanoni, Enrico %A Paccagnella, Alessandro %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1750-1753 %T Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#DanesinZGRMZP06 %V 46

@article{journals/mr/DanesinZGRMZP06, added-at = {2022-10-02T00:00:00.000+0200}, author = {Danesin, Francesca and Zanon, Franco and Gerardin, Simone and Rampazzo, Fabiana and Meneghesso, Gaudenzio and Zanoni, Enrico and Paccagnella, Alessandro}, biburl = {https://www.bibsonomy.org/bibtex/2adaf04395c380adb28a9165f8db1778d/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.066}, interhash = {c221b32fb2e6d5ed3d66c8329735c145}, intrahash = {adaf04395c380adb28a9165f8db1778d}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1750-1753}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#DanesinZGRMZP06}, volume = 46, year = 2006 }