%0 Conference Paper %1 conf/dft/AsamiHYA20 %A Asami, Ryuki %A Hosokawa, Toshinori %A Yoshimura, Masayoshi %A Arai, Masayuki %B DFT %D 2020 %E Dilillo, Luigi %E Psarakis, Mihalis %E Siddiqua, Taniya %I IEEE %K dblp %P 1-6 %T A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT. %U http://dblp.uni-trier.de/db/conf/dft/dft2020.html#AsamiHYA20 %@ 978-1-7281-9457-8

@inproceedings{conf/dft/AsamiHYA20, added-at = {2020-11-17T00:00:00.000+0100}, author = {Asami, Ryuki and Hosokawa, Toshinori and Yoshimura, Masayoshi and Arai, Masayuki}, biburl = {https://www.bibsonomy.org/bibtex/2c2ffbae6f60cf12085582cb4f0a8779e/dblp}, booktitle = {DFT}, crossref = {conf/dft/2020}, editor = {Dilillo, Luigi and Psarakis, Mihalis and Siddiqua, Taniya}, ee = {https://doi.org/10.1109/DFT50435.2020.9250810}, interhash = {cda3ba51f6bd6e83386c5d609272cdc7}, intrahash = {c2ffbae6f60cf12085582cb4f0a8779e}, isbn = {978-1-7281-9457-8}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2020-11-19T11:37:48.000+0100}, title = {A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2020.html#AsamiHYA20}, year = 2020 }