%0 Conference Paper %1 conf/isvlsi/TouatiB0VBR16 %A Touati, Aymen %A Bosio, Alberto %A Girard, Patrick %A Virazel, Arnaud %A Bernardi, Paolo %A Reorda, Matteo Sonza %B ISVLSI %D 2016 %I IEEE Computer Society %K dblp %P 731-736 %T Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#TouatiB0VBR16 %@ 978-1-4673-9039-2

@inproceedings{conf/isvlsi/TouatiB0VBR16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Touati, Aymen and Bosio, Alberto and Girard, Patrick and Virazel, Arnaud and Bernardi, Paolo and Reorda, Matteo Sonza}, biburl = {https://www.bibsonomy.org/bibtex/2c3090f47709bf2b80daa892a8cfc3280/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2016}, ee = {https://www.wikidata.org/entity/Q60245295}, interhash = {836e18296fa0ea8b13c8285782f0d483}, intrahash = {c3090f47709bf2b80daa892a8cfc3280}, isbn = {978-1-4673-9039-2}, keywords = {dblp}, pages = {731-736}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T11:08:57.000+0200}, title = {Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#TouatiB0VBR16}, year = 2016 }