%0 Conference Paper %1 conf/ats/TianGSM03 %A Tian, Yuxin %A Grimaila, Michael R. %A Shi, Weiping %A Mercer, M. Ray %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 354-359 %T Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#TianGSM03 %@ 0-7695-1951-2

@inproceedings{conf/ats/TianGSM03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Tian, Yuxin and Grimaila, Michael R. and Shi, Weiping and Mercer, M. Ray}, biburl = {https://www.bibsonomy.org/bibtex/2d28a177824dc2f299d87058d21d31164/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250836}, interhash = {f108330c713144f1e4e272511494747e}, intrahash = {d28a177824dc2f299d87058d21d31164}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {354-359}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#TianGSM03}, year = 2003 }