%0 Conference Paper %1 conf/itc/TsaiBC98 %A Tsai, Huan-Chih %A Bhawmik, Sudipta %A Cheng, Kwang-Ting %B ITC %D 1998 %I IEEE Computer Society %K dblp %P 1065-1073 %T An almost full-scan BIST solution-higher fault coverage and shorter test application time. %U http://dblp.uni-trier.de/db/conf/itc/itc1998.html#TsaiBC98 %@ 0-7803-5093-6

@inproceedings{conf/itc/TsaiBC98, added-at = {2023-03-23T00:00:00.000+0100}, author = {Tsai, Huan-Chih and Bhawmik, Sudipta and Cheng, Kwang-Ting}, biburl = {https://www.bibsonomy.org/bibtex/2c9505182824ecf63adae396b7713aa78/dblp}, booktitle = {ITC}, crossref = {conf/itc/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743305}, interhash = {584feea9855c8bc9d22a813015ab3123}, intrahash = {c9505182824ecf63adae396b7713aa78}, isbn = {0-7803-5093-6}, keywords = {dblp}, pages = {1065-1073}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:01.000+0200}, title = {An almost full-scan BIST solution-higher fault coverage and shorter test application time.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#TsaiBC98}, year = 1998 }