%0 Journal Article %1 journals/tcad/ArumiMFEHK13 %A Arumí, Daniel %A Rodríguez-Montañés, Rosa %A Figueras, Joan %A Eichenberger, Stefan %A Hora, Camelia %A Kruseman, Bram %D 2013 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 2 %P 301-312 %T Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. %U http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#ArumiMFEHK13 %V 32

@article{journals/tcad/ArumiMFEHK13, added-at = {2020-09-24T00:00:00.000+0200}, author = {Arumí, Daniel and Rodríguez-Montañés, Rosa and Figueras, Joan and Eichenberger, Stefan and Hora, Camelia and Kruseman, Bram}, biburl = {https://www.bibsonomy.org/bibtex/25817483c5e847472d9d08135b3b68f00/dblp}, ee = {https://doi.org/10.1109/TCAD.2012.2228269}, interhash = {87b3a4b91fba0d1722d30548952f7c0f}, intrahash = {5817483c5e847472d9d08135b3b68f00}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 2, pages = {301-312}, timestamp = {2020-09-25T11:50:13.000+0200}, title = {Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#ArumiMFEHK13}, volume = 32, year = 2013 }