%0 Conference Paper %1 conf/icecsys/RosaBWOR15 %A Rosa, Felipe %A Brum, Raphael Martins %A Wirth, Gilson I. %A Ost, Luciano %A Reis, Ricardo %B ICECS %D 2015 %I IEEE %K dblp %P 137-140 %T Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2015.html#RosaBWOR15 %@ 978-1-5090-0246-7

@inproceedings{conf/icecsys/RosaBWOR15, added-at = {2022-10-13T00:00:00.000+0200}, author = {Rosa, Felipe and Brum, Raphael Martins and Wirth, Gilson I. and Ost, Luciano and Reis, Ricardo}, biburl = {https://www.bibsonomy.org/bibtex/2cc802c1a4c8ceac6926c65e9a5c8e465/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2015}, ee = {https://doi.org/10.1109/ICECS.2015.7440268}, interhash = {8c98c129ead55b158926c41bef734d71}, intrahash = {cc802c1a4c8ceac6926c65e9a5c8e465}, isbn = {978-1-5090-0246-7}, keywords = {dblp}, pages = {137-140}, publisher = {IEEE}, timestamp = {2024-04-10T09:53:01.000+0200}, title = {Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2015.html#RosaBWOR15}, year = 2015 }