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Disambiguation of "Wirth, Gilson I."

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Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability.

, , , , and . ICECS, page 137-140. IEEE, (2015)

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Gilson Inácio Wirth

Gilson Martins

Norbert Gilson

Gilson Braviano

Hanny Gilson

 

Other publications of authors with the same name

Single event transients in combinatorial circuits., , , and . SBCCI, page 121-126. ACM, (2005)Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors., , , , , and . LATS, page 1-6. IEEE, (2018)Generation and Propagation of Single Event Transients in CMOS Circuits., , , and . DDECS, page 198-203. IEEE Computer Society, (2006)An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS., , , and . ICECS, page 195-198. IEEE, (2009)Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability., , , , and . ICECS, page 137-140. IEEE, (2015)Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants., , , , , and . Microelectron. Reliab., 52 (12): 2955-2961 (2012)Statistical and Numerical Approach for a Computer efficient circuit yield analysis., , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-24. Springer, (2007)Using Bulk Built-in Current Sensors to Detect Soft Errors., , , , and . IEEE Micro, 26 (5): 10-18 (2006)Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics., , and . Microelectron. Reliab., 54 (12): 2760-2765 (2014)Novel analytical and numerical approach to modeling low-frequency noise in semiconductor devices, , and . Physica A: Statistical Mechanics and its Applications, 362 (2): 277--288 (Apr 1, 2006)