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Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability.

, , , , and . ICECS, page 137-140. IEEE, (2015)

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Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies., , , , and . Microelectron. Reliab., 50 (9-11): 1241-1246 (2010)Selected Articles from the 6th International Workshop on CMOS Variability, Salvador, Bahia, Brazil, September 1-4, 2015., and . J. Low Power Electron., 12 (1): 56-57 (2016)Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (11): 4772-4782 (2021)Unbalacing the I/O Pins Partitioning for Minimizing Inter-Tier Vias in 3D VLSI Circuits., , , and . ICECS, page 399-402. IEEE, (2006)Overhead for independent net approach for Global Routing., , and . LASCAS, page 1-4. IEEE, (2015)Reducing the number of transistors with gate clustering., , and . LASCAS, page 163-166. IEEE, (2016)Process Variability Challenges for Radiation Mitigation Techniques on 16nm., , and . LASCAS, page 69-72. IEEE, (2019)Efficient emulation of quantum circuits on classical hardware., and . LASCAS, page 1-4. IEEE, (2015)Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders., , , and . ICECS, page 290-293. IEEE, (2017)Exploring more efficient architectures for Multiple Dynamic Supply Voltage designs., , , and . LASCAS, page 1-4. IEEE, (2014)