Inproceedings,
1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing.
P. Tchatchoua, G. Graton, M. Ouladsine, J. Muller, A. Traoré, and M. Juge.ICCAD, page 1-6. IEEE, (2022)
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- conf/iccad2/TchatchouaGOMTJ22
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- inproceedings
- booktitle
- ICCAD
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- 2022
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/iccad2/2022
- ee
- https://doi.org/10.1109/ICCAD55197.2022.9853997
- isbn
- 978-1-6654-9794-7
- url
- http://dblp.uni-trier.de/db/conf/iccad2/iccad2022.html#TchatchouaGOMTJ22
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- please select -%0 Conference Paper
%1 conf/iccad2/TchatchouaGOMTJ22
%A Tchatchoua, Philip
%A Graton, Guillaume
%A Ouladsine, Mustapha
%A Muller, Julien
%A Traoré, Abraham
%A Juge, Michel
%B ICCAD
%D 2022
%I IEEE
%K dblp
%P 1-6
%T 1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing.
%U http://dblp.uni-trier.de/db/conf/iccad2/iccad2022.html#TchatchouaGOMTJ22
%@ 978-1-6654-9794-7
@inproceedings{conf/iccad2/TchatchouaGOMTJ22,
added-at = {2023-04-25T00:00:00.000+0200},
author = {Tchatchoua, Philip and Graton, Guillaume and Ouladsine, Mustapha and Muller, Julien and Traoré, Abraham and Juge, Michel},
biburl = {https://www.bibsonomy.org/bibtex/2787e65658d838dc15d1f33ff39114e8e/dblp},
booktitle = {ICCAD},
crossref = {conf/iccad2/2022},
ee = {https://doi.org/10.1109/ICCAD55197.2022.9853997},
interhash = {a06ca17709be97e22f95b829abb795e3},
intrahash = {787e65658d838dc15d1f33ff39114e8e},
isbn = {978-1-6654-9794-7},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T10:12:10.000+0200},
title = {1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing.},
url = {http://dblp.uni-trier.de/db/conf/iccad2/iccad2022.html#TchatchouaGOMTJ22},
year = 2022
}