%0 Conference Paper %1 conf/icra/ChangCJ05 %A Chang, Chuan-Yu %A Chang, Jia-Wei %A Jeng, MuDer %B ICRA %D 2005 %I IEEE %K dblp %P 3000-3005 %T An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. %U http://dblp.uni-trier.de/db/conf/icra/icra2005.html#ChangCJ05

@inproceedings{conf/icra/ChangCJ05, added-at = {2013-02-20T00:00:00.000+0100}, author = {Chang, Chuan-Yu and Chang, Jia-Wei and Jeng, MuDer}, biburl = {https://www.bibsonomy.org/bibtex/23749ed4c349c38b7ea64f76b368381df/dblp}, booktitle = {ICRA}, crossref = {conf/icra/2005}, ee = {http://dx.doi.org/10.1109/ROBOT.2005.1570570}, interhash = {e8ac6f310805ee977c797e94f7c83ef6}, intrahash = {3749ed4c349c38b7ea64f76b368381df}, keywords = {dblp}, pages = {3000-3005}, publisher = {IEEE}, timestamp = {2013-02-21T12:02:17.000+0100}, title = {An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.}, url = {http://dblp.uni-trier.de/db/conf/icra/icra2005.html#ChangCJ05}, year = 2005 }