Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Case Study and Advanced Functional Safety Solution for Automotive SoCs., and . ITC, page 1-8. IEEE, (2018)Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (3): 562-575 (2019)An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters., , , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)Impact of process variations on read failures in SRAMs., , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)An Efficient External Memory Test Solution: Case Study for HPC Application., , , , , , , and . VTS, page 1-4. IEEE, (2023)Utilizing ECC Analytics to Improve Memory Lifecycle Management., , , and . ITC, page 383-387. IEEE, (2023)Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs., , , , and . ITC, page 1-6. IEEE, (2018)Memory FIT Rate Mitigation Technique for Automotive SoCs., , , , , , , and . ITC, page 1-6. IEEE, (2019)SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor., , , , and . ITC, page 388-392. IEEE, (2023)On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI., , , , and . ETS, page 1-4. IEEE, (2023)