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Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays.

, и . DFT, стр. 11-20. IEEE Computer Society, (1996)

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H Glenn Penny

Rob Chapman

Jeffrey Chapman

Henry Chapman

Andreas Glennemeier

 

Другие публикации лиц с тем же именем

Yield improvement of a large area magnetic field sensor array using redundancy schemes., и . IEEE Trans. Very Large Scale Integr. Syst., 5 (1): 28-33 (1997)Statistical identification and analysis of defect development in digital imagers., , , и . Digital Photography, том 7250 из SPIE Proceedings, стр. 72500. SPIE, (2009)A Monolithic Hough Transform Processor Based on Restructurable VLSI., , , , , и . IEEE Trans. Pattern Anal. Mach. Intell., 10 (1): 106-110 (1988)Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip., , и . DFT, стр. 3-10. IEEE Computer Society, (2001)Experimental study and analysis of soft and permanent errors in digital cameras., , , , и . DFT, стр. 11-14. IEEE Computer Society, (2016)Fault Tolerance for Islandable-Microgrid Sensors., и . DFT, стр. 1-4. IEEE, (2021)Correcting high-density hot pixel defects in digital imagers., , , и . IMSE, том 9022 из SPIE Proceedings, стр. 90220G. SPIE, (2014)Hot Pixel Behavior as Pixel Size Reduces to 1 micron., , , и . IMSE, стр. 39-45. Society for Imaging Science and Technology, (2017)Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO., , , и . Sensors, Cameras, and Systems for Industrial and Scientific Applications, том 8659 из SPIE Proceedings, стр. 86590C. SPIE, (2013)Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's., и . FPGA, стр. 17-23. ACM, (1997)