( en | de | ru )

 

Disambiguation of "Song, Tai"

Author of the publication

copydeleteadd this publication to your clipboard
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements.

, , , , , , , and . J. Circuits Syst. Comput., 31 (13): 2250231:1-2250231:17 (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Song Song

Song Song

Xavier Taixés i Ventosa

Theoretical and algorithmic aspects of congruences between modular Galois representations. Uni Duisburg-Essen, (2009)

Nahla Tai

Tai Fei

 

Other publications of authors with the same name

A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications., , , , , , and . Integr., (2022)Valid test pattern identification for VLSI adaptive test., , , and . Integr., (2022)Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC., , , , , , , and . IEEE Trans. Circuits Syst., 67-II (11): 2657-2661 (2020)Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix., , , , , , and . IEEE Trans. Aerosp. Electron. Syst., 59 (6): 9357-9367 (December 2023)Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation., , , and . J. Electron. Test., 39 (2): 189-205 (April 2023)Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy., , , , , , and . J. Circuits Syst. Comput., 33 (5): 2450092:1-2450092:25 (March 2024)VLSI test through an improved LDA classification algorithm for test cost reduction., and . Microelectron. J., (2022)Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm., , , , , , and . IEEE Access, (2020)Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory., , , , , , and . VTS, page 1-6. IEEE, (2019)Machine learning classification algorithm for VLSI test cost reduction., , and . Integr., (2022)