Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.

T. Song, H. Liang, T. Ni, Z. Huang, Y. Lu, J. Wan, and A. Yan. IEEE Access, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Zhengfeng Zhang

Zhengfeng Qian

Feiqing Huang

Haishi Huang

Zhida Huang

Other publications of authors with the same name

A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, and H. Liang. ITC-Asia, page 139-144. IEEE, (2019)Design of Wireless Network on Chip with Priority-Based MAC.Y. Ouyang, Y. Zhao, K. Xing, Z. Huang, H. Liang, and J. Li. Journal of Circuits, Systems, and Computers, 28 (8): 1950124:1-1950124:18 (2019)Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS.A. Yan, Z. Huang, X. Fang, Y. Ouyang, and H. Deng. Microelectron. J., (2017)Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction.H. Xu, R. Zhu, X. Sun, X. Fang, P. Qi, H. Liang, and Z. Huang. J. Circuits Syst. Comput., 32 (10): 2350175:1-2350175:19 (August 2023)Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement.Z. Huang, J. Bian, Y. Lin, H. Liang, and T. Ni. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (1): 71-84 (January 2024)Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier.Z. Huang, Z. Su, T. Ni, Q. Xu, H. Qi, Y. Lu, M. Eric, and H. Xu. J. Circuits Syst. Comput., 30 (5): 2120003:1-2120003:16 (2021)A Compact TRNG Design for FPGA Based on the Metastability of RO-driven Shift Registers.Q. Peng, J. Bian, Z. Huang, S. Wang, and A. Yan. ACM Trans. Design Autom. Electr. Syst., 29 (1): 13:1-13:17 (January 2024)Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications.A. Yan, Z. He, J. Zhou, J. Cui, T. Ni, Z. Huang, X. Wen, and P. Girard. Microelectron. J., (2021)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications.A. Yan, J. Xiang, Y. Chang, Z. Huang, J. Cui, P. Girard, and X. Wen. Microelectron. J., (September 2023)A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications.A. Yan, Z. Xu, K. Yang, J. Cui, Z. Huang, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 56 (4): 2666-2676 (2020)

BibSonomy

Disambiguation of "Huang, Zhengfeng"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.

Please choose a person to relate this publication to

Zhengfeng Zhang

Zhengfeng Qian

Feiqing Huang

Haishi Huang

Zhida Huang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Huang, Zhengfeng"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.

Please choose a person to relate this publication to

Zhengfeng Zhang

Zhengfeng Qian

Feiqing Huang

Haishi Huang

Zhida Huang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.