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A NOC closed-loop performance monitor and adapter., , , , , , и . Microprocess. Microsystems, 37 (6-7): 661-671 (2013)Accurate and computer efficient modelling of single event transients in CMOS circuits., , и . IET Circuits Devices Syst., 1 (2): 137-142 (2007)Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies., , , , , и . VLSI-SoC, стр. 78-83. IEEE, (2007)A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip., , , , , , , и . IEEE Trans. Computers, 57 (9): 1202-1215 (2008)Single event transients in combinatorial circuits., , , и . SBCCI, стр. 121-126. ACM, (2005)Generation and Propagation of Single Event Transients in CMOS Circuits., , , и . DDECS, стр. 198-203. IEEE Computer Society, (2006)A multiple bit upset tolerant SRAM memory., , , и . ACM Trans. Design Autom. Electr. Syst., 8 (4): 577-590 (2003)12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011., , , , и . J. Low Power Electron., 7 (4): 529-530 (2011)Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity., , , , , , и . VLSI-SoC, стр. 1-6. IEEE, (2014)A Novel Phase-Based Low Overhead Fault Tolerance Approach for VLIW Processors., , , , , и . ISVLSI, стр. 485-490. IEEE Computer Society, (2015)