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Disambiguation of "Ciappa, Mauro"

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A Multilevel CMOS&\#x02013;MEMS Design Methodology Based on Response Surface Models

, , , , , , and . Journal of Microelectromechanical Systems, (2011)
DOI: 10.1109/jmems.2011.2140352

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Mauro Ciappa

Christian Mauro

Frank Mauroschat

Jacopo Mauro

Carola Mauroschat-Galla

 

Other publications of authors with the same name

Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy., , , and . Microelectron. Reliab., 50 (9-11): 1407-1412 (2010)Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications., , , and . European Test Symposium, page 170-174. IEEE Computer Society, (2010)Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy., , , , and . ESSDERC, page 357-360. IEEE, (2014)A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy., , and . Microelectron. Reliab., 43 (9-11): 1651-1656 (2003)Selected failure mechanisms of modern power modules.. Microelectron. Reliab., 42 (4-5): 653-667 (2002)Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation., and . IRPS, page 1-8. IEEE, (2021)Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications., , , and . ETS, page 67-72. IEEE Computer Society, (2009)Lifetime Modeling and Prediction of Power Devices. CIPS2008, (2008)Characterization of self-heating effects in semiconductor resistors during transmission line pulses., , , , , and . Microelectron. Reliab., 44 (9-11): 1873-1878 (2004)A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment., , , and . J. Electron. Test., 27 (1): 19-30 (2011)