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Quantitative Analysis of In-Field Defects in Image Sensor Arrays.

, , , , и . DFT, стр. 526-534. IEEE Computer Society, (2007)

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Raymond Leung

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Statistical identification and analysis of defect development in digital imagers., , , и . Digital Photography, том 7250 из SPIE Proceedings, стр. 72500. SPIE, (2009)Predicting Pixel Defect Rates Based on Image Sensor Parameters., , , , и . DFT, стр. 408-416. IEEE Computer Society, (2011)Tradeoffs in Imager Design with Respect to Pixel Defect Rates., , , и . DFT, стр. 231-239. IEEE Computer Society, (2010)Characterization of Gain Enhanced In-Field Defects in Digital Imagers., , , и . DFT, стр. 155-163. IEEE Computer Society, (2009)A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects., , , и . DFT, стр. 517-525. IEEE Computer Society, (2007)Workload Evaluations for Closed Captioners., , , , , , и . ICCHP-AAATE (1), том 13341 из Lecture Notes in Computer Science, стр. 529-535. Springer, (2022)Tradeoffs in imager design parameters for sensor reliability., , , , и . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, том 7875 из SPIE Proceedings, стр. 78750I. SPIE, (2011)Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO., , , , , и . Sensors, Cameras, and Systems for Industrial and Scientific Applications, том 8298 из SPIE Proceedings, стр. 82980E. SPIE, (2012)Quantitative Analysis of In-Field Defects in Image Sensor Arrays., , , , и . DFT, стр. 526-534. IEEE Computer Society, (2007)Automatic Detection of In-field eld Defect Growth in Image Sensors., , , и . DFT, стр. 305-313. IEEE Computer Society, (2008)