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Does the Floorplan of a Chip Affect Its Yield?, и . DFT, стр. 159-166. IEEE Computer Society, (1993)Tradeoffs in imager design parameters for sensor reliability., , , , и . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, том 7875 из SPIE Proceedings, стр. 78750I. SPIE, (2011)Dependence of SEUs in Digital Cameras on Pixel size and Elevation., , , , и . DFT, стр. 1-4. IEEE, (2021)Do more camera pixels result in a better picture?, , и . IOLTS, стр. 73-78. IEEE Computer Society, (2012)Improved correction for hot pixels in digital imagers., , , , и . DFT, стр. 116-121. IEEE Computer Society, (2014)On-Line Mapping of In-Field Defects in Image Sensor Arrays., , , , , и . DFT, стр. 439-447. IEEE Computer Society, (2006)Measuring the Vulnerability of Interconnection Networks in Embedded Systems., , , и . IPPS/SPDP Workshops, том 1388 из Lecture Notes in Computer Science, стр. 919-924. Springer, (1998)On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components., и . ICDCS, стр. 26-32. IEEE Computer Society, (1988)A statistical study of defect maps of large area VLSI IC's., , и . IEEE Trans. Very Large Scale Integr. Syst., 2 (2): 249-256 (1994)Statistical identification and analysis of defect development in digital imagers., , , и . Digital Photography, том 7250 из SPIE Proceedings, стр. 72500. SPIE, (2009)