( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
An Improved MOS Self-Biased Ring Amplifier and Modified Auto-Zeroing Scheme.

, , , и . IEEE Trans. Very Large Scale Integr. Syst., 31 (4): 606-610 (апреля 2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Changchun Ge

Changchun Yin

Wenqiang Chai

Jingjing Chai

Jianfang Chai

 

Другие публикации лиц с тем же именем

An Improved MOS Self-Biased Ring Amplifier and Modified Auto-Zeroing Scheme., , , и . IEEE Trans. Very Large Scale Integr. Syst., 31 (4): 606-610 (апреля 2023)Two novel PSRR enhancement techniques for voltage reference of depletion NMOS., , , , и . IEICE Electron. Express, 19 (8): 20220009 (2022)Upset and damage mechanisms of the three-dimensional silicon device induced by high power microwave interference., , , , , , , и . IEICE Electron. Express, 16 (19): 20190498 (2019)A new method to improve the phase noise performance of the frequency synthesizer for UHF RFID., , и . IEICE Electron. Express, 16 (5): 20181151 (2019)Damage effects and mechanism of GaAs solar cells induced by high-power microwaves., , , , , , и . IEICE Electron. Express, 18 (5): 20210020 (2021)Target Tracking Approximation Algorithms with Particle Filter Optimization and Fault-Tolerant Analysis in Wireless Sensor Networks., , , , и . J. Networks, 7 (5): 832-837 (2012)An IAOT controlled current-mode buck converter with RC-based inductor current sensor., , , , и . IEICE Electron. Express, 17 (4): 20190757 (2020)A high-linearity capacitance-to-digital converter with capacitive offset cancellation technique., , , и . IEICE Electron. Express, 17 (18): 20200268 (2020)Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter., , , и . Sci. China Inf. Sci., 58 (8): 1-11 (2015)Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse., , , , , , и . Microelectron. Reliab., (2016)