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Reduced overhead soft error mitigation using error control coding techniques.

, , and . IOLTS, page 163-168. IEEE Computer Society, (2011)

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Low Power Test for Nanometer System-on-Chips (SoCs)., , and . J. Low Power Electron., 4 (1): 81-100 (2008)State Assignment for Optimal Design of Monitored Self-Checking Sequential Circuits., , and . VLSI Design, page 15-20. IEEE Computer Society, (1993)A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx., , , , and . ITC, page 417-425. IEEE Computer Society, (2000)DFT for Test Optimisations in a Complex Mixed-Signal SOC - Case Study on TI's TNETD7300 ADSL Modem Device., and . ITC, page 773-782. IEEE Computer Society, (2004)Evaluation of Entropy Driven Compression Bounds on Industrial Designs., , , , and . ATS, page 13-18. IEEE Computer Society, (2008)Reduced overhead soft error mitigation using error control coding techniques., , and . IOLTS, page 163-168. IEEE Computer Society, (2011)Methodology for low power test pattern generation using activity threshold control logic., , and . ICCAD, page 526-529. IEEE Computer Society, (2007)Session Abstract.. VTS, page 86-87. IEEE Computer Society, (2006)Test time reduction using parallel RF test techniques., , and . VTS, page 40. IEEE Computer Society, (2010)Monitoring machine based synthesis technique for concurrent error detection in finite state machines., , and . J. Electron. Test., 8 (2): 179-201 (1996)