Author of the publication

EM algorithm for one-shot device testing under the exponential distribution.

, and . Comput. Stat. Data Anal., 56 (3): 502-509 (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Prognostics for lithium-ion batteries using a two-phase gamma degradation process model., , , , , and . Reliab. Eng. Syst. Saf., (2021)Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress., and . IEEE Trans. Reliability, 62 (2): 537-551 (2013)Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution., and . IEEE Trans. Reliability, 61 (3): 809-821 (2012)EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution., , and . IEEE Trans. Reliability, 65 (2): 973-991 (2016)Comparison of algorithms to simulate disease transmission., , , , and . J. Simulation, 11 (3): 285-294 (2017)Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data., and . IEEE Trans. Reliability, 66 (3): 641-650 (2017)EM algorithm for one-shot device testing with competing risks under exponential distribution., , and . Reliab. Eng. Syst. Saf., (2015)Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process., , and . IEEE Trans. Reliability, 64 (1): 463-472 (2015)EM algorithm for one-shot device testing under the exponential distribution., and . Comput. Stat. Data Anal., 56 (3): 502-509 (2012)Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions., and . Reliab. Eng. Syst. Saf., (2020)