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EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution., , и . IEEE Trans. Reliability, 65 (2): 973-991 (2016)Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress., и . IEEE Trans. Reliability, 62 (2): 537-551 (2013)Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution., и . IEEE Trans. Reliability, 61 (3): 809-821 (2012)Prognostics for lithium-ion batteries using a two-phase gamma degradation process model., , , , , и . Reliab. Eng. Syst. Saf., (2021)EM algorithm for one-shot device testing under the exponential distribution., и . Comput. Stat. Data Anal., 56 (3): 502-509 (2012)Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions., и . Reliab. Eng. Syst. Saf., (2020)Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process., , и . IEEE Trans. Reliability, 64 (1): 463-472 (2015)Comparison of algorithms to simulate disease transmission., , , , и . J. Simulation, 11 (3): 285-294 (2017)Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data., и . IEEE Trans. Reliability, 66 (3): 641-650 (2017)EM algorithm for one-shot device testing with competing risks under exponential distribution., , и . Reliab. Eng. Syst. Saf., (2015)