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Full-chip subthreshold leakage power prediction and reduction techniques for sub-0.18-μm CMOS., , , , and . IEEE J. Solid State Circuits, 39 (3): 501-510 (2004)Quantum phenomena in field-effect-controlled semiconductor nanostructures., , , , and . Proc. IEEE, 79 (8): 1106-1116 (1991)Implementation of InGaAs-OI Passive Devices and Its Application to 5G Millimeter-Wave Phase Shifter., , , , , and . BCICTS, page 1-4. IEEE, (2019)A boundary element method for modeling viscoelastic flow in thermal oxidation., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 7 (2): 215-224 (1988)Scanning the Issue., , , , , , , , , and 9 other author(s). Proc. IEEE, 108 (4): 483-484 (2020)Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage., , , , , , and . IEEE J. Solid State Circuits, 37 (11): 1396-1402 (2002)A workstation approach to IC process and device design., and . IEEE Des. Test, 5 (2): 36-47 (1988)Monolithically Integrated GaN+CMOS Logic Circuits Design and Electro-Thermal Analysis for High-Voltage Applications., , , , , , , and . BCICTS, page 1-4. IEEE, (2020)A Boundary Integral Equation Approach to Oxidation Modeling., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 4 (4): 398-403 (1985)EP1: Moore's law challenges below 10nm: Technology, design and economic implications., , , and . ISSCC, page 1. IEEE, (2015)