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Parameter-specific ring oscillator for process monitoring at the 45 nm node., , , , , and . CICC, page 1-4. IEEE, (2010)SRAM stability characterization using tunable ring oscillators in 45nm CMOS., , , , , and . ISSCC, page 354-355. IEEE, (2010)Fully Integrated CMOS Power Amplifier With Efficiency Enhancement at Power Back-Off., , , and . IEEE J. Solid State Circuits, 43 (3): 600-609 (2008)Mechanical Computing Redux: Relays for Integrated Circuit Applications., , , , , and . Proc. IEEE, 98 (12): 2076-2094 (2010)Compensation of systematic variations through optimal biasing of SRAM wordlines., , , , and . CICC, page 411-414. IEEE, (2008)Technologies for Cofabricating MEMS and Electronics., , , and . Proc. IEEE, 96 (2): 306-322 (2008)A Density Metric for Semiconductor Technology Point of View., , , , , , , , and . Proc. IEEE, 108 (4): 478-482 (2020)Quasi-Planar Tri-gate (QPT) bulk CMOS technology for single-port SRAM application., , , , , and . ISQED, page 270-274. IEEE, (2012)Characterization of Dynamic SRAM Stability in 45 nm CMOS., , , and . IEEE J. Solid State Circuits, 46 (11): 2702-2712 (2011)Scanning the Issue., , , , , , , , , and 9 other author(s). Proc. IEEE, 108 (4): 483-484 (2020)