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Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain., , , and . Microelectron. Reliab., 45 (2): 279-285 (2005)Transient latch-up: experimental analysis and device simulation., , , , , , , and . Microelectron. Reliab., 45 (2): 297-304 (2005)Transient-induced latch-up test setup for wafer-level and package-level., , , , , and . Microelectron. Reliab., 46 (9-11): 1629-1633 (2006)Investigating the CDM susceptibility of IC's at package and wafer level by capacitive coupled TLP., , and . Microelectron. Reliab., 49 (12): 1476-1481 (2009)ESD Susceptibility of Submicron Air Gaps., , , and . Microelectron. Reliab., 46 (9-11): 1587-1590 (2006)A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits., , , and . Microelectron. Reliab., 45 (9-11): 1421-1424 (2005)Establishing an Infrastructure for Remote Access to Microdata at Eurostat., and . Privacy in Statistical Databases, volume 6344 of Lecture Notes in Computer Science, page 249-257. Springer, (2010)Accounting for institutional quality in global forest modeling., , , , , , , and . Environ. Model. Softw., (2018)