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A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM., , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1697-1710 (2019)Variation-aware Fault Modeling and Test Generation for STT-MRAM., , , , and . IOLTS, page 80-83. IEEE, (2019)Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Dynamic Faults based Hardware Trojan Design in STT-MRAM., , , and . DATE, page 933-938. IEEE, (2020)Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory., , and . ETS, page 1-6. IEEE, (2020)Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis., , , , , , , , and . VTS, page 1-10. IEEE, (2020)Mitigating Read Failures in STT-MRAM., , and . VTS, page 1-6. IEEE, (2020)A Spintronics Memory PUF for Resilience Against Cloning Counterfeit., , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (11): 2511-2522 (2019)Variation Analysis, Fault Modeling and Yield Improvement of Emerging Spintronic Memories. Karlsruhe University, Germany, (2020)base-search.net (ftubkarlsruhe:oai:EVASTAR-Karlsruhe.de:1000119696).Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects., , , , , , , and . IRPS, page 1-6. IEEE, (2019)