( en | de | ru )

 

Disambiguation of "Ishikawa, Yuki"

Author of the publication

copydeleteadd this publication to your clipboard
Bifurcation of multiple-input parallel dc-dc converters with dynamic winner-take-all switching.

, and . ISCAS, page 789-792. IEEE, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Toshiyuki Ishikawa

Yuki Norizoe

Yuki Sugimoto

Satomi Ishikawa

Kenichi Ishikawa

 

Other publications of authors with the same name

Realization of 0.7-V analog circuits by adaptive-Vt operation of FinFET., , , , , , , , , and 1 other author(s). CICC, page 1-4. IEEE, (2010)High-Frequency Precise Characterization of Intrinsic FinFET Channel., , , , , , , , , and 3 other author(s). IEICE Trans. Electron., 95-C (4): 752-760 (2012)Piecewise Constant Switched Dynamical Systems in Power Electronics., , , , and . Int. J. Bifurc. Chaos, 17 (10): 3373-3386 (2007)Guidelines for symmetric threshold voltage in tunnel FinFETs with single and dual metal gate electrodes., , , , , , , , , and 5 other author(s). ESSDERC, page 202-205. IEEE, (2013)Analysis of charge-to-hot-carrier degradation in Ge pFinFETs., , , , and . IRPS, page 1-4. IEEE, (2020)Skill Abstraction of Physical Therapists in Hemiplegia Patient Rehabilitation Using a Walking Assist Robot., , , , , , , , and . Int. J. Autom. Technol., 13 (2): 271-278 (2019)PBTI for N-type tunnel FinFETs., , , , , , , , , and 4 other author(s). ICICDT, page 1-4. IEEE, (2015)Bifurcation of multiple-input parallel dc-dc converters with dynamic winner-take-all switching., and . ISCAS, page 789-792. IEEE, (2007)A support system for probability learning based on scaffolding approach., , and . ITI, page 205-210. IEEE, (2013)A 0.7-V Opamp in Scaled Low-Standby-Power FinFET Technology., , , , , , , , , and 2 other author(s). IEICE Trans. Electron., 95-C (4): 686-695 (2012)